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Author

Jinho Lee

Observed name: Lee, Jinho
Observed institution: Seoul National University
ORCID: 0000-0003-4010-6611
Observed ORCID: 0000-0003-4010-6611
OpenAlex ID: A5148870775
SePArate: Segmenting Patterns from Defects in Wafer Manufacturing Using Weak Supervision
2026 · Kwon, Dain, Shin, Changmin, et al. · arXiv (Cornell University)
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TopGQ: Fast GNN Post-Training Quantization Leveraging Topology Information
2026 · Dain Kwon, Kanghyun Choi, et al. · ACM/IEEE Design Automation Conference (DAC)
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STARLINC: Satellite Trail Artifact Removal Using Inter-frame Correlation
2026 · Shingeon Kim, Hyeyoon Lee, et al. · Lecture notes in computer science
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Works count: 3
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