Author

Yuna Chun

Observed name: Chun, Yuna

Institutions: National Institute of Standards and Technology, Massachusetts Institute of Technology

Observed institutions: National Institute of Standards and Technology, Massachusetts Institute of Technology

OpenAlex ID: A5150890752

Spectroscopy With Intelligent Feature Tracking for automated characterization of excited-state structure in semiconductor quantum dot devices

2026 · Huffman, A. R., Schug, Daniel, et al. · arXiv (Cornell University)

Works count: 1

Citation count:

H-index:

I10-index: