Author

Shengyu Tao

Observed name: Tao, Shengyu

Institutions: Chalmers University of Technology, University of California, Berkeley

Observed institutions: Chalmers University of Technology, University of California, Berkeley

OpenAlex ID: A5159135547

Data for: Mechanical stress as the root cause for low-voltage degradation in commercial sodium-ion batteries

2026 · Quade, Katharina Lilith, Schütte, Moritz, et al. · Zenodo (CERN European Organization for Nuclear Research)

Works count: 1

Citation count:

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