Concept

Drop test

OpenAlex ID: C2775865969
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2005 · Yi-Shao Lai, Ping-Feng Yang, et al. · Microelectronics Reliability · 181
2012 · Tara Rahmani, Behnam Kiani, et al. · Construction and Building Materials · 176
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2004 · Tong Yan Tee, Jing-en Luan, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 161
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2010 · Yifei Hao, Hong Hao, et al. · International Journal of Protective Structures · 158
2005 · Desmond Y.R. Chong, F.X. Che, et al. · Microelectronics Reliability · 158
2019 · Huawei Li, Wensu Chen, et al. · International Journal of Impact Engineering · 144
2010 · Ercan Sevkat, Benjamin Liaw, et al. · Composites Part B Engineering · 144
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2016 · Vempati Srinivasa Rao, Chai Tai Chong, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 131
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2020 · Huawei Li, Wensu Chen, et al. · International Journal of Impact Engineering · 118
2007 · Masazumi Amagai · Microelectronics Reliability · 112
Works count: 4,538
Citation count: 29,440
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