Defense Microelectronics Activity

Alternate names: DOD's Defense Microelectronics Activity, Department of Defense Microelectronics Activity, DoD DMEA

ROR: 0118apn21

OpenAlex ID: I4405270614

Electromigrated nanogaps: A review on the fabrications and applications

2021 · Youngsang Kim, Charles H. Ang, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 14

Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory

2021 · Megan C. Casey, Scott D. Stansberry, et al. · IEEE Transactions on Nuclear Science · 13

On the relationship between semiconductor manufacturing volume, yield, and reliability

2017 · Jeffrey Siddiqui, John Ortega, et al. · IEEE International Reliability Physics Symposium proceedings · 10

An Interactive Workshop For High School Teachers To Develop And Teach Pre Engineering Curricula

2020 · Steven de Haas, S.K. Ramesh, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 6

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Inelastic Electron Tunneling Spectroscopy: Investigation of Bulk Dielectrics and Molecules

2021 · Youngsang Kim, Soon W. Chang · IEEE Transactions on Electron Devices · 4

A First Look at 22 nm FDSOI SRAM Single-Event Test Results

2018 · Megan C. Casey, Scott D. Stansberry, et al. · NASA Technical Reports Server (NASA) · 4

Split-Fabric: A Novel Wafer-Scale Hardware Obfuscation Methodology using Silicon Interconnect Fabric

2022 · Yousef Safari, Yu-Tao Yang, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 3

Characterization of Ferroelectric Random Access Memory (FRAM) Storage Capacitors

2020 · Sahar Hihath, Hannah Harter, et al. · Microscopy and Microanalysis · 3

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Software Automation and Optimization of an X-ray Microscope Custom Designed for Integrated Circuit Inspection

2018 · Michael Sutherland, Christopher Powell, et al. · Microscopy and Microanalysis · 3

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Combined effects of gamma radiation and temperature on fiber optic systems

1999 · David W. Pentrack, Roger A. Greenwell, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3

Formation Mechanism and Complex Faulting Behavior of a BPD Loop in 180 μm Thick 4H-SiC Epitaxial Layer

2025 · Ze Yu Chen, Nadeemullah A. Mahadik, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 2

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PMOS NBTI analysis of a 45nm CMOS-SOI process with nitrided gate dielectric

2012 · K. B. Geoghegan, J. J. Siddiqui, et al. · IEEE International Integrated Reliability Workshop final report · 2

Design and fabrication of a fiber Bragg grating temperature sensor

1999 · Sundaram K. Ramesh, Kuo C. Wong · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

Assuring the Cybersecurity of COTS Processors in Space Systems

2024 · Jeffery Lim, Allan Nesathurai, et al. · IEEE Physical Assurance and Inspection of Electronics (PAINE) · 1

Laser beam shaping with computer-generated holograms for fiducial marking

2019 · Alkan Gulses, Shaildhish Rai, et al. · Laser Beam Shaping · 1

Mode-converting coupler for silicon-on-sapphire devices

2015 · S. Zlatanovic, B. W. Offord, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Experiments from optical engineering and robotics for a pre-engineering program

2002 · S.K. Ramesh, L. Andrew, et al. · IEEE Frontiers in Education Conference (FIE) · 1

Radiation testing of electro-optic devices in compliance with IEEE 1156.4

1999 · Roger A. Greenwell, David W. Pentrack, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Development of Custom Test Solution for Validation of Reverse Engineered Circuit Card Assemblies for MIL-Aero Systems

2022 · Kevin Hartmann · SAE technical papers on CD-ROM/SAE technical paper series

Product reliability and qualifications for high consequence/low volume integrated circuits: Discussion group, Oct. 10, 2017

2017 · Gaddi Haase, Jean Yang-Scharlotta, et al. · IEEE International Integrated Reliability Workshop final report

Environmental Effects on Data Retention in Flash Cells

2017 · Rich Katz, David Flowers, et al.

High reliability/supply chain risks

2014 · Daniel Marrujo · IEEE International Integrated Reliability Workshop final report

Microsensors for border patrol applications

2005 · Dwight Falkofske, Brian Krantz, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

MicroSensors Systems: detection of a dismounted threat

2005 · Bill Davis, Victor Berglund, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Maritime avionics subsystems and technologies: advanced graphics and data fusion

2002 · F. Adagio, N. Babiak, et al. · IEEE/AIAA Digital Avionics Systems Conference (DASC)

Works count: 26

Citation count: 198