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Nidec Advance Technology (Japan)
Homepage:
nidec.com
Alternate names:
Nidec Advance Technology Corporation,
Nidec-Read Corporation,
Read Electronics,
ニデックアドバンステクノロジー,
日本電産リード
Parent institution:
Nidec (Japan)
ROR:
05e461f46
OpenAlex ID:
I4405285425
Cost-effective Capacitive Testing for Fine Pitch RDL First
2018
·
Keita Gunji
, Toshihisa Hibarino
·
IEEE Electronics Packaging Technology Conference (EPTC)
·
5
Exact Equality of the MSEs for Two Types of Nonlinear Adaptive Systems: Saturation and Dead-Zone Types
2024
·
Seiji Miyoshi
, Yua Yamaguchi
·
IEEE Access
·
1
Improve inductive contact failure loss of IGBT module test
2021
·
Keita Gunji
·
IEEE CPMT Symposium Japan (ICSJ)
Practical characterization of micro fine RDL failure on PLP
2020
·
Keita Gunji
, Noriaki Takagi
, et al.
·
IEEE Electronics Packaging Technology Conference (EPTC)
Failure detection technique for 2/2um RDL on FOPLP
2019
·
Keita Gunji
, Noriaki Takagi
, et al.
·
IEEE Electronics Packaging Technology Conference (EPTC)
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Works count:
5
Citation count:
11
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