Journal of Electron Microscopy Technique
Source
EELS log‐ratio technique for specimen‐thickness measurement in the TEM
1988 · T. Malis, Shangcong Cheng, et al. · Journal of Electron Microscopy Technique
Controlled environment vitrification system: An improved sample preparation technique
1988 · Jayesh Bellare, H. T. Davis, et al. · Journal of Electron Microscopy Technique
The preparation of cross‐section specimens for transmission electron microscopy
1984 · J. C. Bravman, Robert Sinclair · Journal of Electron Microscopy Technique