Source

ARFTG Microwave Measurement Conference

Source type: conference

Alternate names: 47th ARFTG Conference Digest, 49th ARFTG Conference Digest, 56th ARFTG Conference Digest, ARFTG Microwave Measurement Conference (ARFTG)

Fully OA: No

DOAJ: No

OpenAlex ID: S4306417708

Comparison of On-Wafer Calibrations

1991 · Dylan F. Williams, Roger B. Marks, et al. · ARFTG Microwave Measurement Conference · 228

LRM and LRRM Calibrations with Automatic Determination of Load Inductance

1990 · Andrew Davidson, Keith Jones, et al. · ARFTG Microwave Measurement Conference · 209

Formulations of the Basic Vector Network Analyzer Error Model including Switch-Terms

1997 · Roger B. Marks · ARFTG Microwave Measurement Conference · 164

VNA Tools II: S-parameter uncertainty calculation

2012 · Michael Wollensack, Johannes Hoffmann, et al. · ARFTG Microwave Measurement Conference · 79

Achieving greater on-wafer S-parameter accuracy with the LRM calibration technique

1989 · Andrew Davidson, Eric Strid, et al. · ARFTG Microwave Measurement Conference · 73

Analysis of Multiconductor Transmission Lines

1988 · T. B. Arabi, T. K. Sarkar · ARFTG Microwave Measurement Conference · 66

Network Analyzer Accuracy Overview

2001 · Douglas Kent Rytting · ARFTG Microwave Measurement Conference · 65

Principles of Nonlinear Active Device Modeling for Circuit Simulation

1988 · David E. Root, Brian Hughes · ARFTG Microwave Measurement Conference · 65

Accurate Characteristic Impedance Measurement on Silicon

1998 · Dylan F. Williams, Uwe Arz, et al. · ARFTG Microwave Measurement Conference · 57

50-GHz Interconnect Design in Standard Silicon Technology

1998 · Bendik Kleveland, Thomas H. Lee, et al. · ARFTG Microwave Measurement Conference · 54

Estimating the Magnitude and Phase Response of a 50 GHz Sampling Oscilloscope Using the "Nose-to-Nose" Method

2000 · Paul D. Hale, Tracy S. Clement, et al. · ARFTG Microwave Measurement Conference · 51

Calibration Comparison Method for Vector Network Analyzers

1996 · Roger B. Marks, Jeffrey A. Jargon, et al. · ARFTG Microwave Measurement Conference · 51

QSOLT: A New Fast Calibration Algorithm for Two Port S Parameter Measurements

1991 · Andrea Ferrero, Umberto Pisani · ARFTG Microwave Measurement Conference · 51

Characterizing Amplifier Modulation Distortion Using a Vector Network Analyzer

2019 · Jan Verspecht, Augustine Stav, et al. · ARFTG Microwave Measurement Conference · 49

Characterizations of asymmetric fixtures with a two-gate approach

2011 · Joel Dunsmore, Ning Cheng, et al. · ARFTG Microwave Measurement Conference · 44

Propagating S-parameter uncertainties to other measurement quantities

2001 · Nick M Ridler, Martin J Salter · ARFTG Microwave Measurement Conference · 43

Calibrating On-Wafer Probes to the Probe Tips

1992 · Dylan F. Williams, Roger B. Marks · ARFTG Microwave Measurement Conference · 42

Sensitivity Analysis of Calibration Standards for SOLT and LRRM

2001 · Amr M. E. Safwat, Leonard Hayden · ARFTG Microwave Measurement Conference · 41

Evaluating and expressing uncertainty in complex S-parameter measurements

2000 · Nick M. Ridler, Martin J. Salter · ARFTG Microwave Measurement Conference · 40

A Novel Experimental Noise Power Ratio Characterization Method for Multicarrier Microwave Power Amplifiers

2000 · T. Reveyrand, D. Barataud, et al. · ARFTG Microwave Measurement Conference · 39

In-Line Multiport Calibration

1998 · Dylan F. Williams, David K. Walker · ARFTG Microwave Measurement Conference · 39

Surface Wave Phenomenon in Wafer Probing Environments

1992 · Edward M. Godshalk · ARFTG Microwave Measurement Conference · 39

Identity Authentication System using a Support Vector Machine (SVM) on Radar Respiration Measurements

2019 · Shekh M M Islam, Ashikur Rahman, et al. · ARFTG Microwave Measurement Conference · 37

Millimeter Wave Vector Analysis Calibration and Measurement Problems Caused by Common Waveguide Irregularities

2000 · Charles Oleson, Anthony Denning · ARFTG Microwave Measurement Conference · 37

Characterizing Components Under Large Signal Excitation: Defining Sensible "Large Signal S-Parameters"?!

1997 · Jan Verspecht, Marc vanden Bossche, et al. · ARFTG Microwave Measurement Conference · 33

Works count: 1,834

Citation count: 7,547

H-index: 30

I10-index: 217

2yr mean citedness: 0.833