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IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Source type:
conference
Alternate name:
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Fully OA:
No
DOAJ:
No
OpenAlex ID:
S4363608262
Cryogenic Operation of 3D Flash Memory for New Applications and Bit Cost Scaling with 6-Bit per Cell (HLC) and Beyond
2021
·
Yuta Aiba
, Hitomi Tanaka
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
31
Self-Heating and Interface Traps Assisted Early Aging Revelation and Reliability Analysis of Negative Capacitance FinFET
2023
·
Rajeewa Kumar Jaisawal
, Sunil Rathore
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
26
Nanosheet FETs and their Potential for Enabling Continued Moore's Law Scaling
2021
·
A. Veloso
, G. Eneman
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
24
Variability Analysis for Ferroelectric Field-Effect Transistors
2021
·
Gihun Choe
, Shimeng Yu
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
20
Technology Trends in 2.5D/3D Packaging and Heterogeneous Integration
2021
·
Masaya Kawano
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
19
Chiplet-based System-on-Chip for Edge Artificial Intelligence
2021
·
Mark Ping Chan Mok
, Chi Hong Chan
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
18
Geometrical influence on Self Heating in Nanowire and Nanosheet FETs using TCAD Simulations
2020
·
Min Jae Kang
, Ilho Myeong
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
18
(Invited) 3D-NAND Reliability: Review of key mechanisms and mitigations
2020
·
Shyam Raghunathan
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
18
BSIM-IMG: Advanced Model for FDSOI Transistors with Back Channel Inversion
2020
·
H. Agarwal
, P. Kushwaha
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
17
Analysis on Process Variation Effect of 3D NAND Flash Memory Cell through Machine Learning Model
2020
·
Jang Kyu Lee
, Kyul Ko
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
17
A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays
2023
·
A. Grill
, J. Michl
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
15
Modeling of Ferroelectric Thin Film Transistors with Amorphous Oxide Semiconductor Channel
2024
·
Wei Zhang
, Jianze Wang
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
14
Cryogenic Characterization and Model Extraction of 5nm Technology Node FinFETs
2023
·
Shivendra Singh Parihar
, Girish Pahwa
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
14
Superior Work Function Variability Performance of Horizontally Stacked Nanosheet FETs for Sub-7-nm Technology and Beyond
2020
·
Akhil Sudarsanan
, Sankatali Venkateswarlu
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
14
Ultralow Power Neuromorphic Accelerator for Deep Learning Using Ni/HfO2/TiN Resistive Random Access Memory
2020
·
Hoang-Hiep Le
, Wei-Chen Hong
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
14
Impact and Quantization of Short-Term Relaxation effect in Analog RRAM
2020
·
Yue. Xi
, Bin Gao
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
14
Performance Comparison of Ge/Si Hetero-Junction Vertical Tunnel FET with and Without Gate-Drain Underlapped Structure with Application to Digital Inverter
2020
·
Manas R. Tripathy
, Ashish K. Singh
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
14
Piezoelectric Micromachined Ultrasonic Transducers for Range-Finding Applications
2021
·
David A. Horsley
, Richard J. Przybyla
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
13
Cost-effective, mask-less, and high-throughput prototyping of flexible hybrid electronic devices using dispense printing and conductive silver ink
2021
·
Sahira Vasquez
, Mattia Petrelli
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
13
A Neural Network-Based Harmonic Suppression Algorithm for Medium-to-High Resolution ADCs
2021
·
Xizhu Peng
, Yihang Mi
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
13
Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data
2021
·
Jiahao Liu
, Fuzuo Zhang
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
13
Switching and Charge Trapping in HfO2-based Ferroelectric FETs: An Overview and Potential Applications
2020
·
Halid Mulaosmanovic
, Evelyn T. Breyer
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
13
Piezoelectric Micromachined Ultrasonic Transducers for Consumer Electronics Applications
2023
·
Lei Zhao
, Yipeng Lu
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
12
Environmental Impact of CMOS Logic Technologies
2022
·
L-A Ragnarsson
, M. Garcia Bardon
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
12
SiGe and Si Gate-All-Around FET Fabricated by Selective Etching the Same Epitaxial Layers
2022
·
Wei-Yuan Chang
, Guang-Li Luo
, et al.
·
IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
·
12
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Works count:
1,867
Citation count:
2,734
H-index:
14
I10-index:
45
2yr mean citedness:
0.61
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