VLSI and Analog Circuit Testing
Topics
Description: This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, ana... more
Related topics (siblings) Cloud Computing and Remote Desktop Technologies, Embedded Systems Design Techniques, Energy Efficiency in Computing, Network Packet Processing and Optimization, Parallel Computing and Optimization Techniques +2 more
Subfield (parent): Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Works count: 47,600
Citations count: 419,300
Response Surface Methodology
1996 · Raymond H. Myers, Douglas C. Montgomery · IIE Transactions
Asymptotically Efficient Rank Invariant Test Procedures
1972 · Richard Peto, Julian Peto · Journal of the Royal Statistical Society Series A (General)
Digital Systems Testing and Testable Design
1994 · M. Abramovici, Melvin A. Breuer, et al. · IEEE eBooks