Work

Reliability Tradeoffs in Design of Cache Memories

Year: 2005

Type: article

Authors: Hossein Asadi, Vilas Sridharan, Mehdi B. Tahoori, David Kaeli

Institution: Northeastern University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W103828327

FWCI: 1.502

Cites: 26

Cited by: 13

Related to: 10