Characterization on Geiger-mode operation of deep diffused silicon APDs
Year: 2015
Type: conference-paper
DOI: 10.1117/12.2188588
Authors: Erik B. Johnson, Xiao J. Chen, Mickel McClish, Richard Farrell, Kofi Vanderpuye, James Christian
Institution: Radiation Monitoring Devices (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1163026768