Software reliability: measurement, prediction, application (professional ed.)
Year: 1989
Type: book
Source: McGraw-Hill, Inc. eBooks
Authors: Donald Musa, A. Iannino, Kazuhira Okumoto
Institution: AT&T (United States)
Language: English
Subfield: Software
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W117667552