Work

Twin Microscope for Contact-free Thickness Measurement of Semiconductor Detectors.

Year: 1971

Type: article

Source: Nuclear Instruments and Methods

Authors: R.E. Schuh, K. Kilian

Language: English

Topic: Particle Detector Development and Performance

Subfield: Nuclear and High Energy Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W122542441

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Related to: 10