Work

IEC system level ESD challenges and effective protection strategy for USB2 interface

Year: 2012

Type: conference-paper

Source: Electrical Overstress/Electrostatic Discharge Symposium

Authors: Stephane Bertonnaud, Charvaka Duvvury, Agha Jahanzeb

Institutions: Texas Instruments (France), Texas Instruments (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1483076524

FWCI: 2.438

Cites: 4

Cited by: 19

Related to: 10