Year: 1981
Type: article
Abstract: A model based on the movement of point defects in an electrostatic field is proposed to interpret the growth behavior of a passive film on a metal surface. This model results in a logarithmic growth law. The theoretical equations derived from the model readily account for experimental data for the growth of a passive film on iron. It is found that the field strength of the film is . The dependence of film/solution interface potential difference on the applied potential (α) was found to be 0.743, and is independent of the identity of the anion in solution. However, the dependence of the potential difference across the film/solution interface on the solution p H (β) is strongly dependent on the identity of the solution anion.
DOI: 10.1149/1.2127591
Authors: C. Y. Chao, L. F. Lin, D. D. Macdonald
Institution: The Ohio State University
Language: English
Subfield: Metals and Alloys
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W1484595209