Design an Effective Pattern Classification Model
Year: 2006
Type: conference-paper
DOI: 10.1007/11760023_1
Authors: Do-Hyeon Kim, Eui-Young Cha, Kwang-Baek Kim
Institutions: Pusan National University, Silla University
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1489765677
