Work

ESD immunity in system designs, system field experiences and effects of PWB layout

Year: 2002

Type: conference-paper

Source: Electrical Overstress/Electrostatic Discharge Symposium

DOI: 10.1109/eosesd.2000.890026

Authors: D.C. Smith, E. Nakauchi

Institutions: Oakwood Laboratories (United States), Planet Labs PBC (United States), Castle Biosciences, Inc. (United States)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1492153937

FWCI: 1.778

Cites: 2

Cited by: 10

Related to: 10