Work

A Generalized Likelihood Ratio Control Chart for Monitoring the Process Mean Subject to Linear Drifts

Year: 2012

Type: article

Source: Quality and Reliability Engineering International

DOI: 10.1002/qre.1404

Authors: Liaosa Xu, Sai Wang, Marion R. Reynolds

Institution: Virginia Tech

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W1501495646

FWCI: 1.455

Cites: 30

Cited by: 13

Related to: 10