Work

Automatic Detection of Region-Mura Defect in TFT-LCD

Year: 2004

Type: article

Source: IEICE Transactions on Information and Systems

Authors: Jae Yeong Lee, Suk I. Yoo

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1506808117

FWCI: 11.27

Cites: 12

Cited by: 99

Related to: 10