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The end of CMOS scaling

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Year: 2005
Type: article
Source: IEEE Circuits and Devices Magazine
DOI: 10.1109/mcd.2005.1388765
Authors: T. Skotnicki, J.A. Hutchby, T. King, H.-S.P. Wong, F. Boeuf
Institutions: STMicroelectronics (France), Semiconductor Research Corporation, University of California, Berkeley, Stanford University
Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed
OpenAlex ID: W1511865672
FWCI: 16.96
Cites: 98
Cited by: 463
Related to: 10
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