Effective Intensity-Based 2D/3D Rigid Registration between Fluoroscopic X-Ray and CT
Year: 2003
Type: conference-paper
Authors: D. Knaan, L. Joskowicz
Institution: Hebrew University of Jerusalem
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1520633619
