Work

MOS structures quality under annealing influence

Year: 2013

Type: conference-paper

Source: International Conference on Applied Electronics

Authors: B. Birouk, M. Bouzerdoum, D. Madi

Institutions: University of Jijel, University of Bouira

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1522316357

FWCI: 0.407

Cites: 10

Cited by: 1

Related to: 10