Work

Reliability and Validity of the Yale-Brown Obsessive-Compulsive Scale in Schizophrenia Patients

Year: 2025

Type: article

Study design: Observational Study

Source: Psychopharmacology Bulletin

DOI: 10.64719/pb.4154

Authors: Lieuwe de Haan, MD, PhD, Britt Hoogeboom, MD, Nico Beuk, MD, Luuk Wouters, Peter M.A.J. Dingemans, PhD, and Don H. Linszen, MD, PhD

Institutions: Amsterdam UMC Location University of Amsterdam, University of Amsterdam, Amsterdam Neuroscience

Language: English

Topic: Obsessive-Compulsive Spectrum Disorders

Subfield: Clinical Psychology

Field: Psychology

Domain: Social Sciences

SDG: Good health and well-being

Open Access status: closed

OpenAlex ID: W152348553

FWCI: 1.125

Cites:

Cited by: 52

Related to: 20