Work

Assessing the Fit of the Model

Year: 2013

Type: book-chapter

Source: Wiley series in probability and statistics

Parent work: Applied Logistic Regression

DOI: 10.1002/9781118548387.ch5

Authors: David W. Hosmer Jr., Stanley Lemeshow, Rodney X. Sturdivant

Institutions: University of Massachusetts Amherst, The Ohio State University, United States Military Academy

Language: English

Topic: Statistical Methods in Epidemiology

Subfield: Statistics and Probability

Field: Mathematics

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1530699170

FWCI: 56.49

Cites:

Cited by: 410

Related to: 10