Work

Test structures for the wafer mapping and correlation of electrical, mechanical and high frequency magnetic properties of electroplated ferromagnetic alloy films

Year: 2015

Type: conference-paper

Source: IEEE International Conference on Microelectronic Test Structures (ICMTS)

DOI: 10.1109/icmts.2015.7106137

Authors: E. Sirotkin, S. Smith, R. Walker, J.G. Terry, A. J. Walton

Institution: University of Edinburgh

Language: English

Topic: Magnetic properties of thin films

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1533706623

FWCI: 3.86

Cites: 10

Cited by: 3

Related to: 10