A TiAl2O5 nanocrystal charge trap memory device
Year: 2010
Type: article
Source: Applied Physics Letters
DOI: 10.1063/1.3496437
Authors: Yue Zhou, Jiang Yin, Hanni Xu, Yidong Xia, Zhiguo Liu, Aidong Li, Youpin Gong, Lin Pu, Feng Yan, Yi Shi
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1537311207