Work

Yield and Reliability in Microwave Circuit and System Design

Year: 1993

Type: book

Authors: M. Meehan, J. Purviance

Language: English

Topic: Probabilistic and Robust Engineering Design

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W1548867998

FWCI: 0.732

Cites:

Cited by: 38

Related to: 10