Work

The thermoreflectance approach in Dynamic Thermometry and Thermophysical Property Measurement for Thermal Design of Electronics

Year: 2012

Type: conference-paper

Source: International Workshop on Thermal Investigations of ICs and Systems

Authors: Peter E. Raad, Pavel L. Komarov

Institution: Southern Methodist University

Language: English

Topic: Thermal properties of materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1560001194

FWCI:

Cites: 3

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Related to: 10