Work

The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction

Year: 2003

Type: conference-paper

Source: Technical digest - International Electron Devices Meeting/Technical digest

DOI: 10.1109/iedm.2002.1175845

Author: R. Baumann

Institution: Texas Instruments (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1564617507

FWCI: 36.33

Cites: 12

Cited by: 319

Related to: 10