Work

Top-Down Attention Control at Feature Space for Robust Pattern Recognition

Year: 2000

Type: conference-paper

Source: Lecture notes in computer science

DOI: 10.1007/3-540-45482-9_13

Authors: Su-In Lee, Soo-Young Lee

Institution: Korea Advanced Institute of Science and Technology

Language: English

Topic: Handwritten Text Recognition Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1567089089

FWCI:

Cites: 12

Cited by: 4

Related to: 10