Work

Surface Defect Inspection of Cold Rolled Strips with Features Based on Adaptive Wavelet Packets

Year: 1997

Type: article

Source: IEICE Transactions on Information and Systems

Authors: Chang Su Lee, Chong‐Ho Choi, Young Lim Choi, Se Ho Choi

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1571985576

FWCI: 1.459

Cites:

Cited by: 14

Related to: 10