Work

A single-element CMOS-based electronic de-embedding technique with TRL level of accuracy

Year: 2015

Type: conference-paper

Source: IEEE MTT-S International Microwave Symposium digest

DOI: 10.1109/mwsym.2015.7166871

Authors: Jun-Chau Chien, Ali M. Niknejad

Institution: University of California, Berkeley

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1573896797

FWCI: 1.234

Cites: 7

Cited by: 3

Related to: 10