Work

Influence of the annealing condition on the BN bonds intensity detected by FTIR characterization

Year: 2011

Type: conference-paper

Source: International Conference on Electrical and Electronics Engineering

Authors: Lynda Saci, R. Mahamdi, F. Mansour, Pierre Temple‐Boyer, E. Scheid

Institutions: University Frères Mentouri Constantine 1, Centre National de la Recherche Scientifique, Laboratoire d'Analyse et d'Architecture des Systèmes

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1574711921

FWCI:

Cites: 17

Cited by: 3

Related to: 10