Work

Research Productivity and Patent Quality: Measurement with Multiple Indicators

Year: 2002

Type: preprint

Source: RePEc: Research Papers in Economics

Authors: Jean O. Lanjouw, Mark Schankerman

Institutions: Brookings Institution, Yale University, University of California, Berkeley, Centre for Economic Policy Research, London School of Economics and Political Science

Language: English

Topic: Intellectual Property and Patents

Subfield: Management of Technology and Innovation

Field: Business, Management and Accounting

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W1577435769

Cites: 22

Cited by: 15

Related to: 10