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Early detection for quality and reliability management

Year: 2015

Type: conference-paper

Source: Proceedings, annual Reliability and Maintainability Symposium/Proceedings. Annual Reliability and Maintainability Symposium

DOI: 10.1109/rams.2015.7105194

Authors: Wei-Ting Kary Chien, Ming Li, Mark Zhang

Institution: Semiconductor Manufacturing International (China)

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W1579929848

FWCI:

Cites: 16

Cited by: 2

Related to: 10