Analysis of thin and thick Films
Year: 2012
Type: book-chapter
Source: Wiley eBooks
Authors: Philippe Le Coustumer, Patrick Chapon, Agnès Tempez, Yuriy Popov, George Thompson, Igor Molchan, Nicolas Trigoulet, Peter Skeldon, Antonino Licciardello, Nunzio Tuccitto, Ivan Delfanti, Katrin Fuhrer, Marc Gonin, James Whitby, Markus Hohl, Christian Tanner, Nerea Bordel Garcia, Lara Lobo Revilla, Jorge Pisonero, Rosario Pereiro, Cristina Gonzalez Gago, Alfredo Sanz Medel, Mihai Ganciu Petcu, Ani Surmeian, Constantin Diplasu, Andreea Groza, Norbert Jakubowski, Roland Dorka, Stela Canulescu, Johann Michler, Philippe Belenguer, Thomas Nelis, Abdellatif Zahri, Philippe Guillot, Laurent Thérèse, Arnaud Littner, Richard Vaux, Julien Malherbe, Frédéric Huneau, Fred Stevie, Hugues François‐Saint‐Cyr
Institutions: Université de Bordeaux, Horiba (France), University of Manchester, University of Catania, Tofwerk (Switzerland), Empa, Universidad de Oviedo, National Institute for Laser Plasma and Radiation Physics, Leibniz Institute for Analytical Sciences - ISAS, Université de Toulouse, Alma Consulting Group, National Institute of Standards and Technology, North Carolina State University, Cameca (France)
Language: English
Subfield: Surfaces, Coatings and Films
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1580707959