Work

Distribution of Trapped Electrons at Interface States in ACTFEL Devices

Year: 1992

Type: article

Source: Defense Technical Information Center (DTIC)

Authors: Susumu Kobayashi, John F. Wager, A. Abu-Dayah

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1589279382

FWCI: 0.936

Cites:

Cited by: 4

Related to: 10