Work

Document Image Defect Models

Year: 1992

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-3-642-77281-8_26

Author: Henry S. Baird

Institution: AT&T (United States)

Language: English

Topic: Handwritten Text Recognition Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1592735339

FWCI: 14.45

Cites: 6

Cited by: 286

Related to: 10