Work

Could cost in a TQM environment

Year: 2002

Type: conference-paper

Source: IEEE Conference on Aerospace and Electronics

DOI: 10.1109/naecon.1990.112967

Authors: M. Ward, G. Erickson, D. Fleming

Language: English

Topic: Technology Assessment and Management

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1593044324

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Related to: 10