Work

Fault tolerant and fault testable hardware design

Year: 1985

Type: article

Source: CERN Document Server (European Organization for Nuclear Research)

Author: P.K. Lala

Institution: Syracuse University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1595174839

FWCI: 15.2

Cites:

Cited by: 326

Related to: 10