Bad and Good Ways of Post-processing Biased Physical Random Numbers
Work
Year: 2007
Type: book-chapter
Author Markus Dichtl
Institution Siemens (Germany)
Cites: 5
Cited by: 64
Related to: 10
FWCI: 4.218
Citation percentile (by year/subfield): 96.8
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: bronze