Structural transformations of Ge2Sb2Te5 films studied by electrical resistance measurements
Year: 2000
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.373041
Institutions: Forschungszentrum Jülich, RWTH Aachen University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1599433024