Step-and-Repeat X-ray/Photo Hybrid Lithography for 0.3 μm Mos Devices
Year: 1985
Type: conference-paper
Source: Symposium on VLSI Technology
Authors: K. Deguchi, Kazuma Komatsu, H. Namatsu, Misao Sekimoto, Masayuki Miyake, Keiji Hirata
Institution: NTT (Japan)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1599891132
