A Patch-Structure Representation Method for Quality Assessment of Contrast Changed Images
Work
Year: 2015
Type: article
Source: IEEE Signal Processing Letters
Institutions University of Waterloo, Nanyang Technological University
Cites: 17
Cited by: 347
Related to: 10
FWCI: 12.88
Citation percentile (by year/subfield): 99.99
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed