Work

Atomic force microscopy in zero-g

Year: 2004

Type: conference-paper

Source: Proceedings - IEEE Aerospace Conference

DOI: 10.1109/aero.2003.1235043

Authors: R. Friedfeld, S. Parker, G. Rodgers, R. Meador, R. Williams, M. Johnson, R. Branly

Institution: Stephen F. Austin State University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1670510253

FWCI:

Cites: 4

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Related to: 10