Effect of Surface Roughness on Critical Current of Niobium Films
Year: 2006
Type: conference-paper
Source: AIP conference proceedings
DOI: 10.1063/1.2355039
Authors: Carsten Mehls, Dale Gill, Christopher Cox, Neel Vora, David Stricker, Eric Berglund, Paritosh Ambekar, Rodney Torii, Suwen Wang
Institution: Stanford University
Language: English
Subfield: Astronomy and Astrophysics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W1672297161