Work

AFM method to detect differences in adhesion of silica bids to cancer and normal epithelial cells

Year: 2009

Type: article

Source: Bulletin of the American Physical Society

Authors: Igor Sokolov, Swaminathan P. Iyer, Ravi Gaikwad, Craig D. Woodworth

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W1672589027

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