False alarm classification for multivariate manufacturing processes of thin film transistor–liquid crystal displays
Year: 2015
Type: article
Source: Journal of Process Control
Authors: Ji Hoon Kang, Seoung Bum Kim
Institutions: Samsung (South Korea), Samsung SDS (South Korea), Korea University
Language: English
Subfield: Statistics, Probability and Uncertainty
Field: Decision Sciences
Domain: Social Sciences
Open Access status: closed
Award: G6848047967
OpenAlex ID: W1674357728