Year: 2003
Type: preprint
Abstract: The manipulation of quantum entanglement has found enormous potential for improving performances of devices such as gyroscopes, clocks, and even computers. Similar improvements have been demonstrated for lithography and microscopy. We present an overview of some aspects of enhancement by quantum entanglement in imaging and metrology.
Source: arXiv (Cornell University)
Authors: Lee, Hwang, Kok, Pieter, Dowling, Jonathan P.
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W1677123028